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website contera

Prof Sonia Antoranz Contera

Professor of Biological Physics

Sub department

  • Condensed Matter Physics
Sonia.AntoranzContera@physics.ox.ac.uk
Telephone: 01865 (2)72269
Clarendon Laboratory, room 275A,211,207,203,208 (office)
  • About
  • Publications
Conversation on physics bioinspired materials and the future of architecture

Scanning tunnelling microscopy images of the copper-containing amine oxidase from arthrobacter globiformis in the holo and apo forms adsorbed on gold under ambient conditions

Japanese Journal of Applied Physics Part 1 Regular Papers and Short Notes and Review Papers 41:6 A (2002) 3916-3921

Authors:

SA Contera, T Okajima, H Iwasaki

Abstract:

Dimeric Arthrobacter globiformis amine oxidase in the holo and apo forms adsorbed onto a Au (111) surface have been observed by scanning tunnelling microscopy (STM) under ambient conditions. Individual protein molecules denature as they adsorb onto a bare Au surface, although they keep a dual appearance. Tapping atomic force microscopy images of individual proteins correspond well with the STM ones in the lateral direction. STM voltage affects the distance between the units of the denatured proteins: negative voltages separate them while positive ones get them together. Disordered as well as ordered layers of apo and holo proteins have been resolved by STM at molecular detail level. Individual proteins lying on the layers present a compact and a distinct dimeric shape, apo dimers looking bigger than holo dimers.

Nanotechnology based on DNA computation

(2001) 45-45

Authors:

Akio Nishikawa, Sonia Antoranz Contera, Wonchul Moon, Tatsuo Yoshinobu, Hiroshi Iwasaki

Atomic surface characterisation and modification of the layered compounds Bi2Se3, Bi1.9Sb0.1Se3 and Bi1.6Sb0.4Se3.

Ultramicroscopy 86:1-2 (2001) 55-61

Authors:

S Antoranz Contera, T Yoshinobu, H Iwasaki, Z Bastl, P Lost谩k

Abstract:

In this work, we show atomic STM images of the layered compound Bi2Se3. We study the effect in the surface of the substitution of 5% and 20% of the Bi atoms for Sb in Bi1.9Sb0.1Se3 and Bi1.6Sb0.4Se3. The images of the three samples show similar trigonal structures corresponding probably to the van der Waals Se atoms. The distance measured between surface atoms in Bi2Se3 is 4.04 A, in Bi1.9Sb0.1Se3 is 4.16 A and in Bi1.6Sb0.4Se3 is 4.26 A. In Bi1.6Sb0.4Se3 some atomic sites appear brighter than others. The effect is accentuated at higher tunnelling currents and is not observed in the other compounds. Nanoscopic range depressions on the sample might be related to the skeletal crystal structure since the images show atomic corrugations that align slightly in one direction. We explain the results as the effects of the interactions between tip and sample, and discuss two interpretations: on the one hand, localised depression of the individual atomic sites, and on the other the possible elevation of the atoms of the surface due to a phase transition of the compounds induced by STM.

Formation of nano-pyramids of layered materials with AFM.

Ultramicroscopy 82:1-4 (2000) 165-170

Authors:

SA Contera, T Yoshinobu, H Iwasaki, Z Bastl, P Lostak

Abstract:

We have been able to raise squares of around 2 A in height of the layered materials Bi1.6Sb0.4Se3, Bi1.9Sb0.1Se3 and Bi2Se3 by means of contact atomic force microscopy in air. By raising squares on/beneath previously produced squares, Mayan-like pyramids have been constructed, each step of the pyramid being around 2 A in height. We neither remove matter from the surface nor produce a localized oxidation of the sample; we elevate a portion of it. When the surface is oxidized, the AFM cantilever pulls the oxide off producing holes. The raising of the squares is also possible in a nitrogen atmosphere.

Nanotribology of clean and oxide-covered silicon surfaces using atomic force microscopy

Japanese Journal of Applied Physics Part 1 Regular Papers and Short Notes and Review Papers 39:1 (2000) 272-274

Authors:

WC Moon, SA Contera, T Yoshinobu, H Iwasaki

Abstract:

Atomic force microscopy (AFM) has been used for tribological studies of silicon surfaces both with and without an oxide layer on the surface. Three different types of surfaces were prepared: a silicon surface with a chemical oxide made by the SC1 process, a silicon surface with a thermal oxide, and a H-terminated silicon surface without an oxide layer. Only in the case of the chemical oxide, scratching of the oxide and ploughing of the silicon by the Si3N4 AFM tip were observed. On the other hand, no wear of the sample was noted on the other surfaces. On these surfaces, the AFM often produced elevated patterns in the shape of the scanned area, which were no longer visible after HF etching. The difference between the tribological behavior of the chemical-oxide-covered surface and that of the other surfaces is discussed in relation to the presence of hydroxyl groups in the oxide layer.

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