First observation and dalitz analysis of the D0 → K S 0ηπ0 Decay
Physical Review Letters 93:11 (2004)
Abstract:
The resonant substructure of the decay D0→K 0sηπ0 was discussed using Dalitz technique. The study also find dominant contributions from a 0(980)K0s and K*(829)η intermediate states. Using an isobar model averaging of four model was made for additional components and find the amplitude, phase and fit fractions. It was shown that the amplitudes and phases were extracted from the fit, derived from fit fraction which integrates its matrix elements amplitude square and allow phase space division.Measurement of the ttbar Production Cross Section in ppbar Collisions at sqrt(s) = 1.96 TeV Using Kinematic Fitting of $b$-tagged Lepton+Jet Events
ArXiv hep-ex/0409029 (2004)
Type inversion in irradiated silicon: a half truth
ArXiv physics/0409049 (2004)
Abstract:
Charge collection measurements performed on heavily irradiated p-spray dofz pixel sensors with a grazing angle hadron beam provide a sensitive determination of the electric field within the detectors. The data are compared with a complete charge transport simulation of the sensor which includes signal trapping and charge induction effects. A linearly varying electric field based upon the standard picture of a constant type-inverted effective doping density is inconsistent with the data. A two-trap double junction model implemented in ISE TCAD software can be tuned to produce a doubly-peaked electric field which describes the data reasonably well at two different fluences. The modeled field differs somewhat from previous determinations based upon the transient current technique. The model can also account for the level of signal trapping observed in the data.Search for Axion-like Particles from the Sun in an Underground Negative-Ion TPC
Nuclear and Particle Physics Proceedings Elsevier 134 (2004) 130-132
Tests of silicon sensors for the CMS pixel detector
Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment Elsevier 530:1-2 (2004) 71-76