Measurement of $b$ hadron masses in exclusive $J/蠄$ decays with the CDF detector
ArXiv hep-ex/0508022 (2005)
Measurement of the Ratios of Branching Fractions B(Bs->Ds- pi+)/B(B0->D-pi+) and B(B+->D0bar pi+)/B(B0->D-pi+)
ArXiv hep-ex/0508014 (2005)
Measurement of the tt虅 production cross section in pp虅 collisions at s=1.96 TeV using lepton plus jets events with semileptonic B decays to muons
Physical Review D Particles Fields Gravitation and Cosmology 72:3 (2005) 1-20
Abstract:
We present a measurement of the tt虅 production cross section using 194 pb-1 of CDF II data using events with a high transverse momentum electron or muon, three or more jets, and missing transverse energy. The measurement assumes 100% t鈫扺b branching fraction. Events consistent with tt虅 decay are found by identifying jets containing heavy-flavor semileptonic decays to muons. The dominant backgrounds are evaluated directly from the data. Based on 20 candidate events and an expected background of 9.5卤1.1 events, we measure a production cross section of 5.3卤3.3-1.0+1.3 pb, in agreement with the standard model. 漏 2005 The American Physical Society.Searches for CP violation and 蟺蟺 S wave in the Dalitz-plot analysis of D0鈫捪�+蟺-蟺0
Physical Review D Particles Fields Gravitation and Cosmology 72:3 (2005) 1-6
Abstract:
In e+e- collisions recorded using the CLEO II.V detector we have studied the Cabibbo suppressed decay of D0鈫捪�+蟺-蟺0 with the initial flavor of the D0 tagged by the decay D*+鈫扗0蟺+. We use the Dalitz-plot analysis technique to measure the resonant substructure in this final state and observe 蟻蟺 and nonresonant contributions by fitting for their amplitudes and relative phases. We describe the 蟺蟺 S wave with a K-matrix formalism and limit this contribution to the rate to be <2.5%@95% confidence level, in contrast to the large rate observed in D+鈫捪�+蟺-蟺+ decay. Using the amplitudes and phases from this analysis, we calculate an integrated CP asymmetry of 0.01-0.07+0.09卤0.05. 漏 2005 The American Physical Society.Simulation of Heavily Irradiated Silicon Pixel Sensors and Comparison With Test Beam Measurements
IEEE Transactions on Nuclear Science Institute of Electrical and Electronics Engineers (IEEE) 52:4 (2005) 1067-1075